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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

来源: 树人论文网 浏览次数:165次
周期:Quarterly
ISSN:1530-4388
影响因子:1.583
是否开源:No
年文章量:98
录用比:较易
学科方向:工程:电子与电气
研究方向:工程技术
通讯地址:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
官网地址:http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298
投稿地址:http://mc.manuscriptcentral.com/tdmr
网友分享经验:较慢,6-12周

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY杂志中文介绍

IEEE设备和材料可靠性事务季刊。它提供对可靠电子设备和材料的创造至关重要的前沿信息,并在电子设备及其制造中使用的材料的可靠性方面成为跨学科交流的重点。它侧重于电子、光学、磁器件和微系统的可靠性;用于制造这些装置的材料和工艺;以及这些材料的界面和表面。

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY杂志英文介绍

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY影响因子

工程:电子与电气领域相关期刊
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